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AMCS
2008

Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

13 years 6 months ago
Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images
Ewa Skubalska-Rafajlowicz
Added 08 Dec 2010
Updated 08 Dec 2010
Type Journal
Year 2008
Where AMCS
Authors Ewa Skubalska-Rafajlowicz
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