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CVPR
1996
IEEE
15 years 2 days ago
Combining greyvalue invariants with local constraints for object recognition
This paper addresses the problem of recognizing objects in large image databases. The method is based on local characteristics which are invariant to simzlarity transformations in...
Cordelia Schmid, Roger Mohr
CVPR
1996
IEEE
15 years 2 days ago
Coregistration of Range and Optical Images Using Coplanarity and Orientation Constraints
A least-squares method simultaneously solves for the model-to-sensor-suite pose and sensor-to-sensor registration. The development is for a sensor-suite containing separate range ...
Anthony N. A. Schwickerath, J. Ross Beveridge
CVPR
1996
IEEE
15 years 2 days ago
Neural Network-Based Face Detection
Henry A. Rowley, Shumeet Baluja, Takeo Kanade
CVPR
1996
IEEE
15 years 2 days ago
Robust Recovery of Camera Rotation from Three Frames
Computing camera rotation from image sequences can serve many computer vision applications. One direct application is image stabilization, and when the camera rotation is known th...
Benny Rousso, Shai Avidan, Amnon Shashua, Shmuel P...
CVPR
1996
IEEE
15 years 2 days ago
Epipolar Geometry and Linear Subspace Methods: A New Approach to Weak Calibration
This paper addresses the problem of estimating the epipolar geometry from point correspondences between two images taken by uncalibrated perspective cameras. It is shown that Jeps...
Jean Ponce, Yakup Genc
CVPR
1996
IEEE
15 years 2 days ago
A Factorization Method for Affine Structure from Line Correspondences
A family of structure from motion algorithms called the factorization method has been recently developed from the orthographic projection model to the afJine camera model [23, i6,...
Long Quan, Takeo Kanade
CVPR
1996
IEEE
15 years 2 days ago
Randomness and Geometric Features in Computer Vision
Xavier Pennec, Nicholas Ayache
CVPR
1996
IEEE
15 years 2 days ago
Bayesian face recognition using deformable intensity surfaces
Baback Moghaddam, Chahab Nastar, Alex Pentland
CVPR
1996
IEEE
15 years 2 days ago
Parametric Feature Detection
Shree K. Nayar, Simon Baker, Hiroshi Murase