Advances in Quantum Computing Fault Tolerance and Testing

We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustrate the inherent need for fault tolerance in QC due to the decoherence problem. Further, we examine several ideas regarding random testing and examine the viability of built-insystem- test (BIST) in future QC circuits.

• Type: Conference
• Year: 2007
• Where: HASE
• Authors: David Y. Feinstein, V. S. S. Nair, Mitchell A. Thornton
• Keywords: Fault Tolerance, Future Qc Circuits, HASE 2007, Quantum Logic Fault