AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis

Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self test functions from the AES cryptoalgorithm hardware implementation in a secure system. Self-test of the proposed implementation is also presented. A statistical test suite and fault-simulation are used for evaluating the efficiency of the corresponding cryptocore as pseudo-random test pattern generator; an analytical approach demonstrates the low probability of aliasing when used for test response compaction.

• Type: Conference
• Year: 2008
• Where: DELTA
• Authors: M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
• Keywords: Builtin Self Test, DELTA 2008, Information Management, Mechanisms Allows Test, Self Test