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ESWA
2008

The application of clustering analysis for the critical areas on TFT-LCD panel

13 years 11 months ago
The application of clustering analysis for the critical areas on TFT-LCD panel
For thin film transistor-liquid crystal displays (TFT-LCD) factories in Taiwan, yield performance had become as an important competitiveness determinant during the competitive environment. As we known, the market for LCDs has grown at over 20% on average per annum and the downward pricing trend had also promoted LCD applications. However, only few studies were proposed to address the related issues for process analysis in TFT-LCD industry from the viewpoint of systems. Particularly, the defect status (i.e. abnormal position) on TFT-LCD panel may represent the clustering effect when there are many defect counts on it. Hence, performing the clustering analysis for those abnormal positions will be an important issue to be addressed in TFT-LCD process. In this study, we will propose an approach incorporating fuzzy adaptive resonance theory (Fuzzy ART) and stepwise regression techniques to achieve such process analysis. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan ...
Kun-Lin Hsieh
Added 10 Dec 2010
Updated 10 Dec 2010
Type Journal
Year 2008
Where ESWA
Authors Kun-Lin Hsieh
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