Technological constraints severely limit the rate at which analog-todigital converters can reliably sample signals. Recently, Tropp et al. proposed an architecture, termed the random demodulator (RD), that attempts to overcome this obstacle for sparse bandlimited signals. One integral component of the RD architecture is a white noiselike, bipolar modulating waveform that changes polarity at a rate equal to the signal bandwidth. Since there is a hardware limitation to how fast analog waveforms can change polarity without undergoing shape distortion, this leads to the RD also having a constraint on the maximum allowable bandwidth. In this paper, an extension of the RD, termed the constrained random demodulator (CRD), is proposed that bypasses this bottleneck by replacing the original modulating waveform with a run-length limited (RLL) modulating waveform that changes polarity at a slower rate than the signal bandwidth. One of the main contributions of the paper is establishing that the ...
Andrew Harms, Waheed U. Bajwa, A. Robert Calderban