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FOCS
2009
IEEE

Blackbox Polynomial Identity Testing for Depth 3 Circuits

14 years 7 months ago
Blackbox Polynomial Identity Testing for Depth 3 Circuits
Neeraj Kayal, Shubhangi Saraf
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where FOCS
Authors Neeraj Kayal, Shubhangi Saraf
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