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    FOCS
    2009
    IEEE
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    Blackbox Polynomial Identity Testing for Depth 3 Circuits

    14 years 6 months ago
    Blackbox Polynomial Identity Testing for Depth 3 Circuits
    Download  web.mit.edu
    Neeraj Kayal, Shubhangi Saraf
    claim paper
    Added 20 May 2010
    Updated 20 May 2010
    Type Conference
    Year 2009
    Where FOCS
    Authors Neeraj Kayal, Shubhangi Saraf
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