Built-in self-test for automatic analog frequency response measurement

—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-Sigma modulation is used to supply different test sine wave signals with different frequencies and phases. The BIST-based hardware implementation can sweep through the frequencies and measure the frequency response of the analog circuit. This approach has been implemented in Verilog and synthesized into a Field Programmable Gate Array where it was used for functional testing of an actual device under test.

• Type: Conference
• Year: 2005
• Where: ISCAS
• Authors: Dayu Yang, Foster F. Dai, Charles E. Stroud
• Keywords: Analog Circuitry, Direct Digital Synthesizer, Field Programmable Gate Array, ISCAS 2005