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Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

15 years 10 months ago
Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices
Kentaroh Katoh, Hideo Ito
Added 11 Jun 2010
Updated 11 Jun 2010
Type Conference
Year 2006
Where ETS
Authors Kentaroh Katoh, Hideo Ito
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