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ITC
1996
IEEE

A Demonstration IC for the P1149.4 Mixed-Signal Test Standard

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A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
Added 07 Aug 2010
Updated 07 Aug 2010
Type Conference
Year 1996
Where ITC
Authors Keith Lofstrom
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