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ITC 1996
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A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
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The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
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Boundary Scan Standard
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Characterization Data
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CMOS Integrated Circuit
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Hardware
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ITC 1996
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Added
07 Aug 2010
Updated
07 Aug 2010
Type
Conference
Year
1996
Where
ITC
Authors
Keith Lofstrom
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Hardware Study Group
Computer Vision