A Demonstration IC for the P1149.4 Mixed-Signal Test Standard

The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.

• Type: Conference
• Year: 1996
• Where: ITC
• Authors: Keith Lofstrom
• Keywords: Boundary Scan Standard, Characterization Data, CMOS Integrated Circuit, Hardware, ITC 1996