The paper presents an overview of a major research project on dependable embedded systems that has started in Fall 2010 and is running for a projected duration of six years. Aim is a ‘dependability co-design’ that spans various levels of abstraction in the design process of embedded systems starting from gate level through operating system, applications software to system architecture. In addition, we present a new classification on faults, errors, and failures. Categories and Subject Descriptors B.8.1 [Performance and Reliability]: Reliability, Testing, and Fault-Tolerance; D.2.4g [Software Engineering]: Reliability; General Terms Reliability Keywords Resilience, Fault-Tolerance, Embedded Systems, MPSoCs, Dependability