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    A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

    14 years 1 months ago
    A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults
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    Fei Wang, Yu Hu, Huawei Li, Xiaowei Li
    claim paper
    Added 12 Oct 2010
    Updated 12 Oct 2010
    Type Conference
    Year 2008
    Where ASPDAC
    Authors Fei Wang, Yu Hu, Huawei Li, Xiaowei Li
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