Abstract - This paper describes the development of a concurrent methodology for standard cell library generation. Use of a novel physical design automation method enables a high degree of concurrency among process, circuit, and layout development. In addition to reducing overall time-to-market, the new method allows optimization to occur simultaneously across the circuit, layout, and process design spaces. The result is libraries with improved density, circuit performance, and process yield.
Donald G. Baltus, Thomas Varga, Robert C. Armstron