DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits

This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to extend a given set of test patterns which is generated from the viewpoint of fault detection to a diagnostic test pattern set with a diagnostic resolution down to a fault equivalence class. The difficult problem of identifying the equivalence of two faults - analogous to the problem of redundancy identification in ATPG - has been solved. The efficiency of the algorithm is demonstrated by experimental results for a set of benchmark circuits. DIATEST, our implementation of the algorithm, either generates diagnostic test patterns for all distinguishable pairs of faults or identifies pairs of faults as being equivalent for each of the benchmark circuits.

• Type: Conference
• Year: 1991
• Where: ICCAD
• Authors: Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners
• Keywords: Algorithm, Diagnostic Test Patterns, Hardware, ICCAD 1991, Single Stuck-at Faults