Dynamic noise analysis in precharge-evaluate circuits

A dynamic noise model is developed and applied to analyze the noise immunity of precharge-evaluate circuits. Considering that the primary source of noise-injection in the circuit is cross-talk, a simple metric represented as voltage-time product can be used to quantify the dynamic noise-margin. This is veri ed by HSPICE simulation on DOMINO gates. A tool is also developed to obtain static and dynamic noise-margins at various points in the circuit. Dynamic noise-margins are translated into maximum allowable coupling capacitances between the pairs of nets for precharge-evaluate logic circuits. An accurate estimate of dynamic noise-margin and coupling coe cient bounds will allow improvement of the circuits in terms of robustness.

• Type: Conference
• Year: 2000
• Where: DAC
• Authors: Dinesh Somasekhar, Seung Hoon Choi, Kaushik Roy, Yibin Ye, Vivek De
• Keywords: DAC 2000, Design Automation, Dynamic Noise Model, Dynamic Noise-margins, Maximum Allowable Coupling