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DAC
2007
ACM

Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits

14 years 4 months ago
Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits
Xin Li, Lawrence T. Pileggi
Added 14 Aug 2010
Updated 14 Aug 2010
Type Conference
Year 2007
Where DAC
Authors Xin Li, Lawrence T. Pileggi
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