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    CVPR
    1996
    IEEE
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    Eigenfeatures for planar pose measurement of partially occluded objects

    15 years 1 months ago
    Eigenfeatures for planar pose measurement of partially occluded objects
    Download  research.microsoft.com
    John Krumm
    claim paper
    Added 12 Oct 2009
    Updated 12 Oct 2009
    Type Conference
    Year 1996
    Where CVPR
    Authors John Krumm
    Comments (0)
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