Functional Illinois Scan Design at RTL

This paper shows that by creating functional scan chains at the register-transfer level (RTL), not only the timing of the circuit can be improved, but also the test data compression provided from the Illinois scan architecture is similar or even better than the gate level counterpart.

• Type: Conference
• Year: 2004
• Where: ICCD
• Authors: Ho Fai Ko, Nicola Nicolici
• Keywords: Functional Scan Chains, Gate Level Counterpart, Hardware, ICCD 2004, Illinois Scan Architecture