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23

GLVLSI
1997
IEEE

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On Generating Test Sets that Remain Valid in the Presence of Undetected Faults

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On Generating Test Sets that Remain Valid in the Presence of Undetected Faults

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Irith Pomeranz, Sudhakar M. Reddy

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Added	06 Aug 2010
Updated	06 Aug 2010
Type	Conference
Year	1997
Where	GLVLSI
Authors	Irith Pomeranz, Sudhakar M. Reddy

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