Locally linear metric adaptation with application to semi-supervised clustering and image retrieval

Many computer vision and pattern recognition algorithms are very sensitive to the choice of an appropriate distance metric. Some recent research sought to address a variant of the conventional clustering problem called semi-supervised clustering, which performs clustering in the presence of some background knowledge or supervisory information expressed as pairwise similarity or dissimilarity constraints. However, existing metric learning methods for semi-supervised clustering mostly perform global metric learning through a linear transformation. In this paper, we propose a new metric learning method which performs nonlinear transformation globally but linear transformation locally. In particular, we formulate the learning problem as an optimization problem and present three methods for solving it. Through some toy data sets, we show empirically that our locally linear metric adaptation (LLMA) method can handle some difficult cases that cannot be handled satisfactorily by previous meth...

• Type: Journal
• Year: 2006
• Where: PR
• Authors: Hong Chang, Dit-Yan Yeung
• Keywords: Metric, Metric Learning, PR 2006, Semi-supervised Clustering