March SS: A Test for All Static Simple RAM Faults

This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.

• Type: Conference
• Year: 2002
• Where: MTDT
• Authors: Said Hamdioui, A. J. van de Goor, Mike Rodgers
• Keywords: Hardware, MTDT 2002, Simple Static Faults, Static Fault Models, Static Faults