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GECCO
2009
Springer

MC/DC automatic test input data generation

14 years 5 months ago
MC/DC automatic test input data generation
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
Added 24 Jul 2010
Updated 24 Jul 2010
Type Conference
Year 2009
Where GECCO
Authors Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
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