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ETS
2006
IEEE

Minimal March Tests for Dynamic Faults in Random Access Memories

14 years 9 days ago
Minimal March Tests for Dynamic Faults in Random Access Memories
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zo
Added 12 Dec 2010
Updated 12 Dec 2010
Type Journal
Year 2006
Where ETS
Authors Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
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