MOSAIC: a multiple-strategy oriented sequential ATPG for integrated circuits

The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of algorithms in several passes to detect faults. Our so–called Multiple Strategy Approach takes into account the existing techniques and algorithms, (improvements are proposed for some of them) and at each step selects the strategy that is best adapted to catch the targeted faults. This work has been done with a focus on designing a real industrial ATPG, able to handle real circuits consisting of several hundreds of thousands of gates.

• Type: Conference
• Year: 1997
• Where: DATE
• Authors: A. Dargelas, C. Gauthron, Yves Bertrand
• Keywords: DATE 1997, Hardware, Multiple Strategy Approach, Sequential Circuits, Test Pattern Techniques