Optimization objectives and models of variation for statistical gate sizing

This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exclusively on the optimization algorithms without considering the effects of the variation models and objective functions. This work empirically derives a simple variation model that is then used to optimize for robustness. Optimal results from example circuits used to study the effect of the statistical objective function on parametric yield. Categories and Subject Descriptors J.6 [Computer-Aided Engineering]: Computer-Aided Design General Terms Algorithms, Design. Keywords Robust design, parametric yield optimization.

• Type: Conference
• Year: 2005
• Where: GLVLSI
• Authors: Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown
• Keywords: GLVLSI 2005, Parametric Yield, Statistical Optimization, Variation Model, VLSI