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    Post-silicon power characterization using thermal infrared emissions

    14 years 28 days ago
    Post-silicon power characterization using thermal infrared emissions
    Download  ic.engin.brown.edu
    Ryan Cochran, Abdullah Nazma Nowroz, Sherief Reda
    claim paper
    Added 06 Dec 2010
    Updated 06 Dec 2010
    Type Conference
    Year 2010
    Where ISLPED
    Authors Ryan Cochran, Abdullah Nazma Nowroz, Sherief Reda
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