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IEICET
2006

A Practical Analog BIST Cooperated with an LSI Tester

14 years 25 days ago
A Practical Analog BIST Cooperated with an LSI Tester
Takanori Komuro, Naoto Hayasaka, Haruo Kobayashi,
Added 12 Dec 2010
Updated 12 Dec 2010
Type Journal
Year 2006
Where IEICET
Authors Takanori Komuro, Naoto Hayasaka, Haruo Kobayashi, Hiroshi Sakayori
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