Probabilistic Event Extraction from RFID Data

Abstract-- We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.

• Type: Conference
• Year: 2008
• Where: ICDE
• Authors: Nodira Khoussainova, Magdalena Balazinska, Dan Suciu
• Keywords: Database, ICDE 2008, Inherent Ambiguity