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DFT
2008
IEEE

On Reducing Circuit Malfunctions Caused by Soft Errors

14 years 7 months ago
On Reducing Circuit Malfunctions Caused by Soft Errors
Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, Xu
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DFT
Authors Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, Xun Tang, Bernd Becker
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