Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver

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• Type: Conference
• Year: 2007
• Where: DAC
• Authors: Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung, Kwang-Ting Cheng
• Keywords: DAC 2007, Design Automation, Http://doi.acm.org/ 10.1145/1389089.1389092 Acm, Ny 10121-0701 Usa