Reliability-Aware Co-Synthesis for Embedded Systems

As technology scales, transient faults have emerged as a key challenge for reliable embedded system design. This paper proposes a design methodology that incorporates reliability into hardware

• Type: Conference
• Year: 2004
• Where: ASAP
• Authors: Yuan Xie, Lin Li, Mahmut T. Kandemir, Narayanan Vijaykrishnan, Mary Jane Irwin
• Keywords: ASAP 2004, Embedded Systems, Hardware, Hardware­software Co-design Paradigm, Multi-rate Embedded Systems