Reliability estimation of a statistical classifier

Pattern classification techniques derived from statistical principles have been widely studied and have proven powerful in addressing practical classification problems. In real-world applications, the challenge is often to cope with unseen patterns i.e., patterns which are very different from those examined during the training phase. The issue with unseen patterns is the lack of accuracy of the classifier output in the regions of pattern space where the density of training data is low, which could lead to a false classification output. This paper proposes a method for estimating the reliability of a classifier to cope with these situations. While existing methods for quantifying the reliability are often based on the class membership probability estimated on global approximations, the proposed method takes into account the local density of training data in the neighborhood of a test pattern. The calculations are further simplified by using the Gaussian mixture model (GMM) to calculate...

• Type: Journal
• Year: 2008
• Where: PRL
• Authors: Pandu Ranga Rao Devarakota, Bruno Mirbach, Björn E. Ottersten
• Keywords: Local Density, PRL 2008, Training Data, Unseen Patterns