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IEICET
2010

Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

13 years 10 months ago
Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic
Jinsoo Bae, Seong Ill Park, Yun Hee Kim, Seokho Yo
Added 26 Jan 2011
Updated 26 Jan 2011
Type Journal
Year 2010
Where IEICET
Authors Jinsoo Bae, Seong Ill Park, Yun Hee Kim, Seokho Yoon, Jongho Oh, Iickho Song, Seong-Jun Oh
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