(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.

• Type: Journal
• Year: 2010
• Where: DELTA
• Authors: Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas
• Keywords: DELTA 2010, Information Technology, RF Parts, Test Requirements, Test Techniques