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ICPR
2010
IEEE

Statistical Fourier Descriptors for Defect Image Classification

14 years 25 days ago
Statistical Fourier Descriptors for Defect Image Classification
Fabian Timm, Thomas Martinetz
Added 12 Jan 2011
Updated 12 Jan 2011
Type Journal
Year 2010
Where ICPR
Authors Fabian Timm, Thomas Martinetz
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