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    DAC
    1992
    ACM
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    SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

    14 years 4 months ago
    SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
    Download  poisson.usc.edu
    Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
    claim paper
    Added 10 Aug 2010
    Updated 10 Aug 2010
    Type Conference
    Year 1992
    Where DAC
    Authors Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
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