A Systematic Approach for Diagnosing Multiple Delay Faults

In the presence of multiple delay faults, automated diagnostic procedures that make a single fault assumption may give an incorrect diagnosis. In this paper, a systematic approach is proposed for delay fault diagnosis under a multiple fault assumption. Information from the failing test vectors are used to construct a list of single and multiple fault suspects that may have caused all of the observed faulty response. The list of suspects is then pruned and ranked in a novel way by using information from the passing test vectors combined with static timing information.

• Type: Conference
• Year: 1998
• Where: DFT
• Authors: Jayabrata Ghosh-Dastidar, Nur A. Touba
• Keywords: DFT 1998, Fault Assumption, Multiple Fault, Single Fault Assumption, VLSI