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MEMICS
2010

Test-Case Generation for Embedded Binary Code Using Abstract Interpretation

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Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
interpretation example conclusion Test-Case Generation for Embedded Binary ng Abstract Interpretation Thomas Reinbacher1 , J
Thomas Reinbacher, Jörg Brauer, Martin Horaue
Added 20 May 2011
Updated 20 May 2011
Type Journal
Year 2010
Where MEMICS
Authors Thomas Reinbacher, Jörg Brauer, Martin Horauer, Andreas Steininger, Stefan Kowalewski
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