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2000
IEEE

Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems

14 years 4 months ago
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to enable test selection at the early design stages by providing a high level fault simulator and associatedblocklevel modeling and traversal capabilities. Experimental results show that the outlined methodolo gy pr ovides superior fault simulation speed-ups while helping to minimize the test time for a mixed-signal receiver system.
Sule Ozev, Alex Orailoglu
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where VTS
Authors Sule Ozev, Alex Orailoglu
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