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» A Bayesian approach to analysis of limit standards
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ICPR
2008
IEEE
14 years 9 months ago
3D rotation invariant local binary patterns
We present a novel method for the fast computation of rotation invariant "local binary patterns" (LBP) on 3D volume data. Unlike a previous publication on 3D LBP, this n...
Hans Burkhardt, Janis Fehr
ICPR
2008
IEEE
14 years 9 months ago
Background variability modeling for statistical layout analysis
Geometric layout analysis plays an important role in document image understanding. Many algorithms known in literature work well on standard document images, achieving high text l...
Faisal Shafait, Joost van Beusekom, Daniel Keysers...
ICCAD
2007
IEEE
105views Hardware» more  ICCAD 2007»
14 years 2 months ago
Victim alignment in crosstalk aware timing analysis
Modeling the effect of coupling noise on circuit delay is a key issue in static timing analysis (STA) and involves the “victimaggressor alignment” problem. As delay-noise depe...
Ravikishore Gandikota, Kaviraj Chopra, David Blaau...
SIGMETRICS
2006
ACM
121views Hardware» more  SIGMETRICS 2006»
14 years 1 months ago
Transient analysis of tree-Like processes and its application to random access systems
A new methodology to assess transient performance measures of tree-like processes is proposed by introducing the concept of tree-like processes with marked time epochs. As opposed...
Jeroen Van Velthoven, Benny Van Houdt, Chris Blond...
SDM
2007
SIAM
86views Data Mining» more  SDM 2007»
13 years 9 months ago
Identifying Bundles of Product Options using Mutual Information Clustering
Mass-produced goods tend to be highly standardized in order to maximize manufacturing efficiencies. Some high-value goods with limited production quantities remain much less stand...
Claudia Perlich, Saharon Rosset