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576views
15 years 7 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CGF
2004
151views more  CGF 2004»
13 years 8 months ago
A Physically-Based Model for Rendering Realistic Scratches
Individually visible scratches, also called isolated scratches, are very common in real world surfaces. Although their microgeometry is not visible, they are individually percepti...
Carles Bosch, Xavier Pueyo, Stéphane M&eacu...
EDBT
1992
ACM
111views Database» more  EDBT 1992»
13 years 11 months ago
Pipelined Query Processing in the DBGraph Storage Model
The DBGraph storage model, designed for main memory DBMS, ensures both data storage compactness and efficient processing for all database operations. By representing the entire da...
Philippe Pucheral, Jean-Marc Thévenin
SYNASC
2005
IEEE
84views Algorithms» more  SYNASC 2005»
14 years 1 months ago
Membrane Computing as a Framework for Modeling Economic Processes
Abstract. This paper is a first step towards a systematic evaluation of the possibilities to use membrane computing as a modeling framework for economics. Membrane computing is a ...
Gheorghe Paun, Radu A. Paun
PUC
2002
82views more  PUC 2002»
13 years 7 months ago
A Location Model for Communicating and Processing of Context
Location is one of the most important elements of context in ubiquitous computing. In this paper we describe a location model, a spatial-aware communication model and an implement...
Michael Beigl, Tobias Zimmer, Christian Decker