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ECCV
2008
Springer
16 years 6 months ago
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
Fabiano Romeiro, Yuriy Vasilyev, Todd Zickler
ECCV
2006
Springer
16 years 6 months ago
An Intensity Similarity Measure in Low-Light Conditions
In low-light conditions, it is known that Poisson noise and quantization noise become dominant sources of noise. While intensity difference is usually measured by Euclidean distanc...
François Alter, Yasuyuki Matsushita, Xiaoou...
MICCAI
2008
Springer
16 years 5 months ago
Conformal Slit Mapping and Its Applications to Brain Surface Parameterization
We propose a method that computes a conformal mapping from a multiply connected mesh to the so-called slit domain, which consists of a canonical rectangle or disk in which 3D curve...
Yalin Wang, Xianfeng Gu, Tony F. Chan, Paul M. ...
MICCAI
2004
Springer
16 years 5 months ago
3D Bayesian Regularization of Diffusion Tensor MRI Using Multivariate Gaussian Markov Random Fields
3D Bayesian regularization applied to diffusion tensor MRI is presented here. The approach uses Markov Random Field ideas and is based upon the definition of a 3D neighborhood syst...
Marcos Martín-Fernández, Carl-Fredri...
IPMI
2003
Springer
16 years 5 months ago
Object-Based Strategy for Morphometry of the Cerebral Cortex
Most of the approaches dedicated to automatic morphometry rely on a point-by-point strategy based on warping each brain towards a reference coordinate system. In this paper, we des...
Jean-Francois Mangin, Denis Rivière, Arnaud...