1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
This paper presents a technique for memory optimization for a class of computations that arises in the field of correlated electronic structure methods such as coupled cluster and...
A. Allam, J. Ramanujam, Gerald Baumgartner, P. Sad...
Architectural advances of modern systems has often been at odds with control complexity, requiring significant effort in both design and verification. This is particularly true ...
A quorum system over a universe of logical elements is a collection of subsets (quorums) of elements, any two of which intersect. In numerous distributed algorithms, the elements ...
Daniel Golovin, Anupam Gupta, Bruce M. Maggs, Flor...
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...