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DFT
2006
IEEE
105views VLSI» more  DFT 2006»
14 years 5 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
IPPS
2006
IEEE
14 years 5 months ago
Memory minimization for tensor contractions using integer linear programming
This paper presents a technique for memory optimization for a class of computations that arises in the field of correlated electronic structure methods such as coupled cluster and...
A. Allam, J. Ramanujam, Gerald Baumgartner, P. Sad...
CASES
2006
ACM
14 years 4 months ago
Extensible control architectures
Architectural advances of modern systems has often been at odds with control complexity, requiring significant effort in both design and verification. This is particularly true ...
Greg Hoover, Forrest Brewer, Timothy Sherwood
PODC
2006
ACM
14 years 4 months ago
Quorum placement in networks: minimizing network congestion
A quorum system over a universe of logical elements is a collection of subsets (quorums) of elements, any two of which intersect. In numerous distributed algorithms, the elements ...
Daniel Golovin, Anupam Gupta, Bruce M. Maggs, Flor...
KBSE
2005
IEEE
14 years 4 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...