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» A Method for Error Rejection in Multiple Classifier Systems
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DFT
2008
IEEE
86views VLSI» more  DFT 2008»
14 years 2 months ago
Enhancing Silicon Debug via Periodic Monitoring
Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is ti...
Joon-Sung Yang, Nur A. Touba
CVPR
2004
IEEE
14 years 9 months ago
Learning Methods for Generic Object Recognition with Invariance to Pose and Lighting
We assess the applicability of several popular learning methods for the problem of recognizing generic visual categories with invariance to pose, lighting, and surrounding clutter...
Fu Jie Huang, Léon Bottou, Yann LeCun
ICCV
2005
IEEE
14 years 9 months ago
Ensuring Color Consistency across Multiple Cameras
Most multi-camera vision applications assume a single common color response for all cameras. However different cameras--even of the same type--can exhibit radically different colo...
Adrian Ilie, Greg Welch
NAACL
1994
13 years 9 months ago
A Report of Recent Progress in Transformation-Based Error-Driven Learning
Most recent research in trainable part of speech taggers has explored stochastic tagging. While these taggers obtain high accuracy, linguistic information is captured indirectly, ...
Eric Brill
ECCV
2004
Springer
14 years 9 months ago
A Robust Algorithm for Characterizing Anisotropic Local Structures
This paper proposes a robust estimation and validation framework for characterizing local structures in a positive multi-variate continuous function approximated by a Gaussian-base...
Kazunori Okada, Dorin Comaniciu, Navneet Dalal, Ar...