This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
The modern industrial facility depends on sensitive electronic equipment that can be shut down suddenly by severe power system disturbances. A large number of these disturbances o...
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
Methods for controlling the adaptation process of an on-line handwritten character recognizer are studied. The classifier is based on the -nearest neighbor rule and it is adapted...
Vuokko Vuori, Jorma Laaksonen, Erkki Oja, Jari Kan...
Energy minimization algorithms for bio-molecular systems are critical to applications such as the prediction of protein folding. Conventional energy minimization methods such as th...
Xiaochun Weng, Lutz Hamel, Lenore M. Martin, Joan ...