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DFT
2005
IEEE
90views VLSI» more  DFT 2005»
14 years 2 months ago
On the Modeling and Analysis of Jitter in ATE Using Matlab
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
HICSS
1997
IEEE
80views Biometrics» more  HICSS 1997»
14 years 18 days ago
Unbundling Power Quality Services: Technical Issues
The modern industrial facility depends on sensitive electronic equipment that can be shut down suddenly by severe power system disturbances. A large number of these disturbances o...
Robert Lasseter
SAC
2002
ACM
13 years 8 months ago
An evolutionary algorithm for reducing integrated-circuit test application time
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
ICPR
2000
IEEE
14 years 19 days ago
Controlling On-Line Adaptation of a Prototype-Based Classifier for Handwritten Characters
Methods for controlling the adaptation process of an on-line handwritten character recognizer are studied. The classifier is based on the -nearest neighbor rule and it is adapted...
Vuokko Vuori, Jorma Laaksonen, Erkki Oja, Jari Kan...
CEC
2005
IEEE
14 years 2 months ago
A genetic algorithm for energy minimization in bio-molecular systems
Energy minimization algorithms for bio-molecular systems are critical to applications such as the prediction of protein folding. Conventional energy minimization methods such as th...
Xiaochun Weng, Lutz Hamel, Lenore M. Martin, Joan ...