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ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
ICCAD
2005
IEEE
14 years 5 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
CODES
2010
IEEE
13 years 6 months ago
2010
IEEE
The Ptolemy project studies modeling, simulation, and design of concurrent, real-time, embedded systems. The focus is on assembly of concurrent components. The key underlying prin...
JSS
2010
13 years 3 months ago
2010
Managing the architectural description (AD) of a complex software system and maintaining consistency among the different models is a demanding task. To understand the underlying p...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
— For 65nm and below devices, even after optical proximity correction (OPC), the gate may still be non-rectangular. There are several limited works on the device and circuit char...