590 search results - page 12 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
CCE
2004
13 years 7 months ago
2004
This work focuses on the basic stochastic decomposition (SD) algorithm of Higle and Sen [J.L. Higle, S. Sen, Stochastic Decomposition, Kluwer Academic Publishers, 1996] for two-st...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
BMCBI
2004
13 years 7 months ago
2004
Background: Subcellular localization of a new protein sequence is very important and fruitful for understanding its function. As the number of new genomes has dramatically increas...
TVLSI
2008
13 years 7 months ago
2008
Exact approaches to combinational equivalence checking, such as automatic test pattern generation-based, binary decision diagrams (BDD)-based, satisfiability-based, and hybrid appr...
BMCBI
2004
13 years 7 months ago
2004
Background: A key step in the analysis of microarray expression profiling data is the identification of genes that display statistically significant changes in expression signals ...