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» A Novel Method to Improve the Test Efficiency of VLSI Tests
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TOOLS
2000
IEEE
13 years 12 months ago
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
Benoit Baudry, Vu Le Hanh, Yves Le Traon
TSE
2010
197views more  TSE 2010»
13 years 2 months ago
A Genetic Algorithm-Based Stress Test Requirements Generator Tool and Its Empirical Evaluation
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
Vahid Garousi
JAR
2010
98views more  JAR 2010»
13 years 2 months ago
Proof-Guided Test Selection from First-Order Specifications with Equality
This paper deals with test case selection from axiomatic specifications whose axioms are quantifier-free first-order formulas with equality. We first prove the existence of an ide...
Delphine Longuet, Marc Aiguier, Pascale Le Gall
BMCBI
2006
165views more  BMCBI 2006»
13 years 7 months ago
Improved variance estimation of classification performance via reduction of bias caused by small sample size
Background: Supervised learning for classification of cancer employs a set of design examples to learn how to discriminate between tumors. In practice it is crucial to confirm tha...
Ulrika Wickenberg-Bolin, Hanna Göransson, M&a...
IOLTS
2002
IEEE
148views Hardware» more  IOLTS 2002»
14 years 13 days ago
Active Replication: Towards a Truly SRAM-Based FPGA On-Line Concurrent Testing
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
Manuel G. Gericota, Gustavo R. Alves, Miguel L. Si...