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» A Novel Method to Improve the Test Efficiency of VLSI Tests
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RE
2005
Springer
14 years 2 months ago
Using Occurrence Properties of Defect Report Data to Improve Requirements
Defect reports generated for faults found during testing provide a rich source of information regarding problematic phrases used in requirements documents. These reports indicate ...
Kimberly S. Wasson, Kendra N. Schmid, Robyn R. Lut...
CEAS
2008
Springer
13 years 11 months ago
Improved Phishing Detection using Model-Based Features
Phishing emails are a real threat to internet communication and web economy. Criminals are trying to convince unsuspecting online users to reveal passwords, account numbers, socia...
André Bergholz, Jeong Ho Chang, Gerhard Paa...
JCB
2008
94views more  JCB 2008»
13 years 9 months ago
Prioritize and Select SNPs for Association Studies with Multi-Stage Designs
Large-scale whole genome association studies are increasingly common, due in large part to recent advances in genotyping technology. With this change in paradigm for genetic studi...
Jing Li
BMCBI
2010
103views more  BMCBI 2010»
13 years 9 months ago
Nonparametric methods for the analysis of single-color pathogen microarrays
Background: The analysis of oligonucleotide microarray data in pathogen surveillance and discovery is a challenging task. Target template concentration, nucleic acid integrity, an...
Omar J. Jabado, Sean Conlan, P. Lan Quan, Jeffrey ...
CHI
2004
ACM
14 years 2 months ago
TNT: a numeric keypad based text input method
With the evolving functionality in television-based (TVbased) information and entertainment appliances, there is an increased need to enable users input text through remote contro...
Magnus Ingmarsson, David Dinka, Shumin Zhai