590 search results - page 84 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
ICDM
2007
IEEE
14 years 1 months ago
2007
IEEE
The problem of evaluating scientific publications and their authors is important, and as such has attracted increasing attention. Recent graph-theoretic ranking approaches have d...
ICDM
2006
IEEE
14 years 1 months ago
2006
IEEE
In spite of the initialization problem, the ExpectationMaximization (EM) algorithm is widely used for estimating the parameters in several data mining related tasks. Most popular ...
HT
2010
ACM
14 years 20 days ago
2010
ACM
The rise of social interactions on the Web requires developing new methods of information organization and discovery. To that end, we propose a generative community-based probabil...
EMNLP
2008
13 years 9 months ago
2008
Minimum-error-rate training (MERT) is a bottleneck for current development in statistical machine translation because it is limited in the number of weights it can reliably optimi...